NIST seeks custom TEM endstation for CHIPS R&D.
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The National Institute of Standards and Technology (NIST) seeks to procure a custom diffractometry and Fourier ptychography endstation for its CHIPS R&D program. The endstation must integrate with an existing transmission electron microscope (TEM) and enable advanced imaging and diffraction capabilities. Key deliverables include design, fabrication, installation, and testing of the custom system. The contractor must have demonstrated experience in custom electron optics and ptychography instrumentation. The contract value is estimated between $100,000 and $1 million, with a performance period of 12-18 months. This is a combined synopsis/solicitation, and offers are due by the specified date.